An Introduction to Mixed-Signal IC Test and Measurement
Price:
$149.00 (04)Description
With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal, and radio-frequency circuits, today's engineer must be fluent in all four circuit types. Written for advanced undergraduate and graduate-level students, as well as engineering professionals, An Introduction to Mixed-Signal IC Test and Measurement, Second Edition, encompasses analog, mixed-signal and radio-frequency circuits tests, with many relevant industrial examples. The text assumes a solid background in analog and digital circuits and a working knowledge of computers and computer programming.An Introduction to Mixed-Signal IC Test and Measurement, Second Edition, includes examples and illustrations--featuring state-of-the-art industrial technology--to enrich and enliven the text. The book also introduces large-scale mixed-signal circuit and individual circuit tests, discusses the value-added benefits of mixed-signal IC testing to a manufacturer's product, and clearly defines the role of the test engineer.
New to This Edition
* A new chapter on RF Test Methods and Fundamentals of RF Testing
* A new chapter on Clock and Serial Data Communications Channel Measurements
* Coverage of RF load board design
* New coverage of probabilistic reasoning for mixed-signal testing
About the Author(s)
Gordon Roberts is James McGill Professor in the Department of Electrical and Computer Engineering at McGill University. He has conducted extensive research on analog integrated circuit design and mixed-signal test issues. Dr. Roberts has published numerous papers at IEEE conferences, coauthored several textbooks related to mixed-signal test and analog integrated circuit design (including SPICE, Second Edition, with Adel Sedra, OUP, 1996), and contributed various specialized volumes to other books.
Friedrich Taenzler is an RF-Engineering Manager at Texas Instruments and a major contributor in the field of RF testing and design.
Mark Burns is a former TI fellow at Texas Instruments and an accomplished expert in mixed-signal IC test and measurement area.
